Self-driven individual with a can-do attitude, and an ability to work in a dynamic group environment
Work independently to generate test plans, run simulations and debug failures on RTL and Gate Level
Strong fundamental knowledge of various Test standards (such as IEEE 1149.10, 1149.6, 1500, 1687) and test formats (such as BSDL, ICL, PDL, STIL, CTL)
Direct experience in silicon bring-up, debug, and validation of DFT features on ATE, debugging ATPG patterns, Compressed ATPG patterns, MBIST and JTAG related issues
Experience with User Defined Fault Models (UDFM) generation like Cell-Aware and other fault models like GDD, SDD
Experience with STA constraints development and analysis for DFT modes and SDF simulations
Ability to communicate and work with multi-disciplined teams across multiple sites and time time zones.