DFT resource with 8+ yrs experience.
- Strong background and experience with Scan design, Clock architecture, ATPG methodology and industry standard tools
 - Worked on Test compressions and decompression scan methodology generating test patterns at block and SoC level.
 - Worked on ATPG test pattern generation stuck-at and at-speed with depth fault coverage analysis identifying issues to meet the coverage targets.
 - Worked on boundary Scan test plan, test coverage with JTAG
 - Understand MBIST concepts and insertion and test the integration at partition and SoC level.
 - Understand the concept of memory redundancy logic.
 - Understand JTAG concepts with all jtag IEEE standards
 - Worked on industry standard DFT tools
 - Strong knowledge on scripting in TCL / Perl / Python.
 - Must possess good communication skills, be a self-driven individual and a good team player
 
Interested can apply karthick.v@acldigital.com