Experience with owning chip level DFT and Post Silicon debug / analysis
Understanding of DFT architectures like JTAG, Scan Compression Techniques (XOR, Adaptive, OP-MISR etc.), scan chain insertion and verification.
Must have experience generating scan patterns and coverage statistics for various fault models like stuck at(Nominal and VBOX), IDDQ, Transition faults, JTAG BSDL, pattern generation for Memories(E-fuse etc.). Experience debugging tester failures of scan patterns, diagnosis and pattern re-generation.
Understanding generation of functional patterns for ATE
Knowledge of at least any one of an industry standard DFT tools (Cadence Modus, Synopsys Tetramax, Mentor Tessent Tools, etc)
Design experience in MBIST / LBIST is an added advantage.
Good understanding of constraints development for physical design implementation / static timing analysis.