Purpose of the Role : The Design for Testability (DFT) engineering organization at L&T Semiconductor Technologies (LTSCT) pioneers innovative methods and technologies in the areas of DFT architecture, verification, and post-silicon bring-up of state-of-the-art semiconductor chips, such as System on a Chip (SoCs), developed using the latest semiconductor technology nodes.
Areas of Responsibilities :
Implement various DFT techniques, including :
Memory Built-In Self-Test (MBIST) insertion.
Compressor-based scan chain insertion.
Boundary Scan (BSCAN) structure insertion compliant with IEEE 1149.1 and 1149.6 standards.
Logic Built-In Self-Test (BIST) for self-test capability.
Analog BIST implementation for selected analog blocks, such as PLLs, ADCs, and DACs.
IO Built-In Self-Test (IOBist) methods for IO structures of SoCs.
Conduct DFT simulations and analyze results to ensure comprehensive test coverage and high quality.
Debug and resolve DFT-related issues throughout the design process.
Experience : 2 to 5 years
Dft Engineer • Hosur, Tamil Nadu, India